Test Evolution’s EV-series platform builds on open industry standards such as PXI, AXIe and PCIe that enable creation of low cost, high performance systems.
EV-Series Overview
- Applications range from silicon characterization to production IC test
- Based on low cost industry standard AXIe and PXI
- Modular design built from interchangeable building blocks for easy configurability
- Air cooled zero footprint design
- Direct-mount device loadboards
- Cable and hard-dock device interfaces
- Supports common manipulator & docking solutions
- Standard prober/handler interfaces
- Full AXIe/PXI clocking, synchronization, and triggering
- Production Test Executive with support for multi-site pin maps, STDF datalog, prober/handler control, etc.
- Test programs developed in MS Visual Studio & NI TestStand
EV-Instrument Series
EV100 Test Instrument- Read More
- Self contained ATE class instrumentation
- 1U AXIe Instrument Slot supporting EV Series Instrumentation
- Up to 192 channels of digital with EV100-DD192
- Up to 48 channels of DUT power supplies with EV100-DPS48
- Cable interface from rear of instrument via a Rear Transition Module (RTM).
- Communications via PCIe which can be daisy chained from 1 instrument to the next
- Instruments compatible with EV Series Test Systems
- Applications developed with EV100 Instruments can be ported to more integrated EV Series Systems
- Ideal for device characterization and production test
EV-Series Platform
EV500 Test System – Read More
- Basic system building block
- 5 AXIe slot system
- Up to 768 channels of digital
- Up to 192 channels of DUT power supplies
- Easily interchangeable device loadboards
- Integrated bidirectional triggering between instruments and external signals
- Customizable cabling and signal routing for external instruments
- Ideal for device characterization and production test
EV518 Test System – Read More
- EV500 Test System
- Integral 18-slot PXI chassis
- Up to 768 channels of digital
- Up to 192 channels of DUT power supplies
- Loadboards compatible with EV500
- Integrated bidirectional triggering between instruments
- Customizable cabling and signal routing for additional instruments
- Customizable 19″ rack space
EV1018 Test System – Read More
- Two (2) EV500 Test Systems
- Integral 18-slot PXI chassis
- Up to 1536 channels of digital
- Up to 384 channels of DUT power supplies
- Multiple loadboard options
- Integrated bidirectional triggering between instruments
- Customizable cabling and signal routing for additional instruments
- Customizable 19″ rack space
EV-Series Custom Configurations – Read More
- Integral EV500 Test System(s)
- Customizable internal 19″ rack space
- Ability to add custom instrumentation
- Integrate one or more additional industry-standard chassis:
- AXIe
- PXI / PXIe
- PCIe
- Simple, flexible cabling and signal routing to testhead
EV-Series Semiconductor Test Services
Test Services – Read More
We offer a variety of services that include:
- Developing test programs and loadboards
- Configuration and final integration of EV-Series test systems
- Design of custom test instrumentation
EV-Series Instruments
CIF – System Module – Read More
- PCIe support for EV-Series test systems
- 32 software controlled Cbits for load board relay control
- User supplies for load board circuitry
- System level trigger matrix and external trigger I/O integration
- System clock support 10 MHz reference, 100 MHz, ext clock option
- Digital Synchronization Module
DPS12 – Device Power Supply – Read More
- 12 independent voltage supply channels
- -20V / +22V in 3 ranges – negative / bipolar / positive
- 6 current ranges 25 uA to 1.2 A, 2.4 A with channel ganging
- Parametric measurement per channel with digitizer memory
- Triggerable measurements and waveform source
DPS48 – Device Power Supply – Preliminary Information
- 48 independent voltage supply channels
- Channels 1-12 compatible with DPS12 connector pinout
- -7.5V / +7.5V
- 6 current ranges 5 uA to 1.2A, with channel ganging
- Parametric measurement per channel with digitizer memory
- Triggerable measurements
DD48 – Digital Subsystem – Read More
- 48 channel mixed-signal digital subsystem
- 100 / 200 / 400 MVectors/sec data rates
- 32 / 64 / 128 MV pattern memory, 128M source/capture memory
- 127 global timing sets / 32 edgesets / 32 period sets
- -2v to 6.0v drive/compare levels with active load
- PMU per channel
- Software debug tools including pattern debugger
DD192 – Digital Subsystem – Read More
- 192 channel mixed-signal digital subsystem
- 100 / 200 MVector/sec data rates
- 64 / 128 MV pattern memory
- 127 global timing sets / 32 edgesets / 32 period sets
- -1.5v to 6.0v drive/compare levels with active load
- PMU per channel
- Software debug tools including pattern debugger
AXIe Starter Board – Read More
- AXIe 3.1 Infrastructure support
- PCI Express Endpoint
- Instrument Clocks
- Calibration Bus and Analog Bus access
- 4 Differential Star Trigger lines
- 152 DUT I/O Signals
Optional Instrumentation Expansion – Read More
- Customizable 19″ rack space in EV518 / EV1018
- Optional industry-standard chassis and instrumentation
- Customizable cabling and signal routing to testhead
Test system and instrument datasheets are available here.
All Test Evolution AXIe chassis and instruments comply with the AXIe 3.1 standard.