The DD48 is a self-contained, single slot AXIe 3.1, 48 channel mixed-signal digital test subsystem. Each DD48 has an independent sequencer controller with pattern generators, and an independent per-channel timing system. Integrated timing generators connect directly to the instrument’s pin electronics. Each board can operate independently or synchronously with other DD48 cards.
Pattern Generator Features
- 32M Unrestricted (128M in HighSpeed Mode) vector memory
- 128M digital sample source/capture memory parallel per channel
- Match mode – parallel and serial.
- Flexible micro-instructions supporting nested loops and subroutines
- Flexible mixed signal triggering
- 8-channel granularity of most functions for test & cost efficiency
Timing & Formatting Features
- 100/200/400 MVpS data rates
- 32 per-pin flexible edge sets
- 32 period sets (10ns to 671mS periods)
- 127 global timing sets on-the-fly
- Window and strobe compare formats
- Flexible drive formats supporting mixed-signal applications
- 4 flexible edges per pin for unique formats & applications
Driver, Comparator & Load Features
- -2v to +6.0v Range
- Active load up to 12mA source and sink
- 1 high voltage driver (12v) per 8pins
Per Pin PMU Features
- Force Voltage, Measure Current
- Force Current, Measure Voltage
- Voltage clamps
- 5 current ranges (2uA to 32mA)
- -2v to +6.0v Range
- Hardware measurement averaging & histogram support
Software / Programming
- Pattern compiler
- Full API access to board functionality and debug capability
- Debug tools including:
- Pattern Debugger
Test system and instrument datasheets are available here.
All Test Evolution AXIe chassis and instruments comply with the AXIe 3.1 standard. 